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<Article>
<Journal>
				<PublisherName>Semnan University Press</PublisherName>
				<JournalTitle>Progress in Physics of Applied Materials</JournalTitle>
				<Issn>2783-4794</Issn>
				<Volume>2</Volume>
				<Issue>1</Issue>
				<PubDate PubStatus="epublish">
					<Year>2022</Year>
					<Month>01</Month>
					<Day>01</Day>
				</PubDate>
			</Journal>
<ArticleTitle>Structural, electrical and optical properties of SnO2: B transparent semiconducting thin films</ArticleTitle>
<VernacularTitle></VernacularTitle>
			<FirstPage>1</FirstPage>
			<LastPage>10</LastPage>
			<ELocationID EIdType="pii">6851</ELocationID>
			
<ELocationID EIdType="doi">10.22075/ppam.2022.26130.1023</ELocationID>
			
			<Language>EN</Language>
<AuthorList>
<Author>
					<FirstName>A. S.</FirstName>
					<LastName>Shamsipoor</LastName>
<Affiliation>School of Physics, Damghan University, Damghan, Iran</Affiliation>

</Author>
<Author>
					<FirstName>Mohammad Mehdi</FirstName>
					<LastName>Bagheri-Mohagheghi</LastName>
<Affiliation>School of Physics, Damghan University, Damghan, Iran</Affiliation>

</Author>
<Author>
					<FirstName>Elham</FirstName>
					<LastName>Mokaripoor</LastName>
<Affiliation>School of Physics, Damghan University, Damghan, Iran</Affiliation>

</Author>
</AuthorList>
				<PublicationType>Journal Article</PublicationType>
			<History>
				<PubDate PubStatus="received">
					<Year>2022</Year>
					<Month>02</Month>
					<Day>17</Day>
				</PubDate>
			</History>
		<Abstract>Boron (B) is considered as an important impurity in semiconductor physics and optoelectronic devices, especially to produce p-type silicon (p-Si). In this paper, we investigate the effect of Boron doping on the structural, electrical, optical, and photo-sensitivity properties of tin oxide (SnO&lt;sub&gt;2&lt;/sub&gt;) semiconductor thin films. Boron doped tin oxide (SnO&lt;sub&gt;2&lt;/sub&gt;: B) thin films were deposited on glass substrates at T&lt;sub&gt;s&lt;/sub&gt;=500 &lt;sup&gt;ͦ&lt;/sup&gt; C for different atomic concentration of x=[B/Sn] = 0, 0.02, 0.04, 0.08, 0.10, 0.20, 0.30, and 0.50 by spray pyrolysis technique.The results of X-ray diffraction (XRD) analysis show the tetragonal rutile SnO&lt;sub&gt;2&lt;/sub&gt;&lt;strong&gt; &lt;/strong&gt;structure with orientation along the (211) plane. The films have polycrystalline structure with granular and island-like grains morphology by Field-Emission Electron Microscope (FE-SEM). The SnO&lt;sub&gt;2&lt;/sub&gt;:B films have shown n-type conductivity and decreasing - increasing behavior of electrical resistivity with B-doping for x ≤ 0.04 and x&gt; 0.04, respectively. Also, carrier concentrations were obtained in the order of 10&lt;sup&gt;18&lt;/sup&gt;-10&lt;sup&gt;20&lt;/sup&gt; cm&lt;sup&gt;-3&lt;/sup&gt;. Average optical transmittance of SnO&lt;sub&gt;2&lt;/sub&gt;:B thin films changed in the range of 65% to 87% in the visible region and SnO&lt;sub&gt;2&lt;/sub&gt;:B (x=0.08) sample has highest transmittance. The optical gap of films was obtained in the range of 3.47-3.87 eV. From the photoconductive results, the x=0.50 film has exhibited the most optical sensitivity under light radiation.</Abstract>
		<ObjectList>
			<Object Type="keyword">
			<Param Name="value">Semiconductor thin films</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">SnO2, Boron, Spray pyrolysis</Param>
			</Object>
		</ObjectList>
<ArchiveCopySource DocType="pdf">https://ppam.semnan.ac.ir/article_6851_1a0cc60b77e33ff1c294c4238499e00a.pdf</ArchiveCopySource>
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