First-Principles Investigation of Erbium Doping and Intrinsic Defects on the Structural and Electronic Properties of Silicon Dioxide

Volume 5, Issue 2, November 2025, Pages 175-185

10.22075/ppam.2025.37283.1142

Adeyemi Joshua Owolabi; Haruna Ali; Mohammed Yusuf Onimisi; Benedict Machu; Alhassan Shuaibu; Isaac Hyuk Daniel; Mary Samuel; Olalekan Joel Awujoola

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